TY - GEN
T1 - High spatial resolution on-chip active magnetic field probe for IC chip-level near field measurements
AU - Shigeta, Y.
AU - Sato, N.
AU - Arai, K.
AU - Yamaguchi, M.
AU - Kageyama, S.
N1 - Publisher Copyright:
© 2014 The Institute of Electronics, Information and Communication Engineer.
PY - 2014/12/23
Y1 - 2014/12/23
N2 - An on chip active magnetic field probe has been developed for IC chip-level magnetic near field measurements. A low noise amplifier (LNA) and a loop coil were implemented in 0.18 μm Si-CMOS technology, and solder-bonded to PCB to complete the probe. Its gain is 13.3 dB at 2 GHz. The probe is applied for magnetic near field evaluation of a test element group (TEG) chip that emulates Long Term Evolution (LTE)-class radio frequency integrated circuit (RFIC) receiver. It is demonstrated to detect on-chip in-band interference sources.
AB - An on chip active magnetic field probe has been developed for IC chip-level magnetic near field measurements. A low noise amplifier (LNA) and a loop coil were implemented in 0.18 μm Si-CMOS technology, and solder-bonded to PCB to complete the probe. Its gain is 13.3 dB at 2 GHz. The probe is applied for magnetic near field evaluation of a test element group (TEG) chip that emulates Long Term Evolution (LTE)-class radio frequency integrated circuit (RFIC) receiver. It is demonstrated to detect on-chip in-band interference sources.
KW - LTE-class receiver
KW - low noise amplifier
KW - magnetic field probe
KW - magnetic near field measurement
UR - http://www.scopus.com/inward/record.url?scp=84942598884&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84942598884&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:84942598884
T3 - IEEE International Symposium on Electromagnetic Compatibility
SP - 569
EP - 572
BT - EMC 2014/Tokyo - 2014 International Symposium on Electromagnetic CompatibiIity, Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2014 International Symposium on Electromagnetic CompatibiIity, EMC 2014
Y2 - 12 May 2014 through 16 May 2014
ER -