High spatial resolution on-chip active magnetic field probe for IC chip-level near field measurements

Y. Shigeta, N. Sato, K. Arai, M. Yamaguchi, S. Kageyama

研究成果: Conference contribution

抄録

An on chip active magnetic field probe has been developed for IC chip-level magnetic near field measurements. A low noise amplifier (LNA) and a loop coil were implemented in 0.18 μm Si-CMOS technology, and solder-bonded to PCB to complete the probe. Its gain is 13.3 dB at 2 GHz. The probe is applied for magnetic near field evaluation of a test element group (TEG) chip that emulates Long Term Evolution (LTE)-class radio frequency integrated circuit (RFIC) receiver. It is demonstrated to detect on-chip in-band interference sources.

本文言語English
ホスト出版物のタイトルEMC 2014/Tokyo - 2014 International Symposium on Electromagnetic CompatibiIity, Proceedings
出版社Institute of Electrical and Electronics Engineers Inc.
ページ569-572
ページ数4
ISBN(電子版)9784885522871
出版ステータスPublished - 2014 12 23
イベント2014 International Symposium on Electromagnetic CompatibiIity, EMC 2014 - Tokyo, Japan
継続期間: 2014 5 122014 5 16

出版物シリーズ

名前IEEE International Symposium on Electromagnetic Compatibility
2014-December
ISSN(印刷版)1077-4076
ISSN(電子版)2158-1118

Other

Other2014 International Symposium on Electromagnetic CompatibiIity, EMC 2014
CountryJapan
CityTokyo
Period14/5/1214/5/16

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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