High spatial resolution on-chip active magnetic field probe for IC chip-level near field measurements

Y. Shigeta; N. Sato; K. Arai; M. Yamaguchi; S. Kageyama

High spatial resolution on-chip active magnetic field probe for IC chip-level near field measurements

Y. Shigeta, N. Sato, K. Arai, M. Yamaguchi, S. Kageyama

工学研究科・電気エネルギーシステム専攻

研究成果: Conference contribution

抄録

An on chip active magnetic field probe has been developed for IC chip-level magnetic near field measurements. A low noise amplifier (LNA) and a loop coil were implemented in 0.18 μm Si-CMOS technology, and solder-bonded to PCB to complete the probe. Its gain is 13.3 dB at 2 GHz. The probe is applied for magnetic near field evaluation of a test element group (TEG) chip that emulates Long Term Evolution (LTE)-class radio frequency integrated circuit (RFIC) receiver. It is demonstrated to detect on-chip in-band interference sources.

本文言語	English
ホスト出版物のタイトル	EMC 2014/Tokyo - 2014 International Symposium on Electromagnetic CompatibiIity, Proceedings
出版社	Institute of Electrical and Electronics Engineers Inc.
ページ	569-572
ページ数	4
ISBN（電子版）	9784885522871
出版ステータス	Published - 2014 12 23
イベント	2014 International Symposium on Electromagnetic CompatibiIity, EMC 2014 - Tokyo, Japan 継続期間: 2014 5 12 → 2014 5 16

出版物シリーズ

名前	IEEE International Symposium on Electromagnetic Compatibility
巻	2014-December
ISSN（印刷版）	1077-4076
ISSN（電子版）	2158-1118

Other

Other	2014 International Symposium on Electromagnetic CompatibiIity, EMC 2014
Country	Japan
City	Tokyo
Period	14/5/12 → 14/5/16

ASJC Scopus subject areas

Condensed Matter Physics
Electrical and Electronic Engineering

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引用スタイル

Shigeta, Y., Sato, N., Arai, K., Yamaguchi, M., & Kageyama, S. (2014). High spatial resolution on-chip active magnetic field probe for IC chip-level near field measurements. In EMC 2014/Tokyo - 2014 International Symposium on Electromagnetic CompatibiIity, Proceedings (pp. 569-572). [6997208] (IEEE International Symposium on Electromagnetic Compatibility; Vol. 2014-December). Institute of Electrical and Electronics Engineers Inc..

High spatial resolution on-chip active magnetic field probe for IC chip-level near field measurements. / Shigeta, Y.; Sato, N.; Arai, K.; Yamaguchi, M.; Kageyama, S.

EMC 2014/Tokyo - 2014 International Symposium on Electromagnetic CompatibiIity, Proceedings. Institute of Electrical and Electronics Engineers Inc., 2014. p. 569-572 6997208 (IEEE International Symposium on Electromagnetic Compatibility; Vol. 2014-December).

研究成果: Conference contribution

Shigeta, Y, Sato, N, Arai, K, Yamaguchi, M & Kageyama, S 2014, High spatial resolution on-chip active magnetic field probe for IC chip-level near field measurements. in EMC 2014/Tokyo - 2014 International Symposium on Electromagnetic CompatibiIity, Proceedings., 6997208, IEEE International Symposium on Electromagnetic Compatibility, vol. 2014-December, Institute of Electrical and Electronics Engineers Inc., pp. 569-572, 2014 International Symposium on Electromagnetic CompatibiIity, EMC 2014, Tokyo, Japan, 14/5/12.

Shigeta Y, Sato N, Arai K, Yamaguchi M, Kageyama S. High spatial resolution on-chip active magnetic field probe for IC chip-level near field measurements. In EMC 2014/Tokyo - 2014 International Symposium on Electromagnetic CompatibiIity, Proceedings. Institute of Electrical and Electronics Engineers Inc. 2014. p. 569-572. 6997208. (IEEE International Symposium on Electromagnetic Compatibility).

Shigeta, Y. ; Sato, N. ; Arai, K. ; Yamaguchi, M. ; Kageyama, S. / High spatial resolution on-chip active magnetic field probe for IC chip-level near field measurements. EMC 2014/Tokyo - 2014 International Symposium on Electromagnetic CompatibiIity, Proceedings. Institute of Electrical and Electronics Engineers Inc., 2014. pp. 569-572 (IEEE International Symposium on Electromagnetic Compatibility).

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