High-resolution transmission electron microscopy observation of liquid-phase bonded aluminum/sapphire interfaces

Christine Marie Montesa, Naoya Shibata, Si Young Choi, Hiroshi Tonomura, Kazuhiro Akiyama, Yoshirou Kuromitsu, Yuichi Ikuhara

    研究成果: Article査読

    7 被引用数 (Scopus)

    抄録

    In this paper, we characterized aluminum/sapphire interface structure by using high-resolution transmission electron microscopy. It was found that step structures of sapphire formed at the aluminum/sapphire interfaces during the liquid-phase bonding. It was discovered that the addition of silicon in aluminum significantly reduces the step growth at the interface. Silicon was found to segregate and precipitate at the interface. These results suggest that the strong preference of silicon at the interface may inhibit the step growth reactions during liquid-phase bonding.

    本文言語English
    ページ(範囲)1037-1040
    ページ数4
    ジャーナルMaterials Transactions
    50
    5
    DOI
    出版ステータスPublished - 2009 5

    ASJC Scopus subject areas

    • 材料科学(全般)
    • 凝縮系物理学
    • 材料力学
    • 機械工学

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