High-resolution in-situ transmission electron microscopy observation of a solid-liquid interface in the Al-Si system

S. Arai, S. Tsukimoto, H. Miyai, H. Saka

    研究成果: Article査読

    23 被引用数 (Scopus)

    抄録

    A solid-liquid interface in the-Al-Si system has been observed at near-atomic resolution by in-situ heating experiments inside transmission electron microscopes. The solid Si/alloy liquid of Al(-Si) interface shows facetting on {111} planes of Si and is very straight on the atomic scale even while it moves during solidification. There exists a transition layer between solid Si and liquid Al(-Si).

    本文言語English
    ページ(範囲)317-321
    ページ数5
    ジャーナルJournal of Electron Microscopy
    48
    4
    DOI
    出版ステータスPublished - 1999

    ASJC Scopus subject areas

    • 器械工学

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