High Resolution Atomic Force Microscopic Imaging of the [Formula presented] Surface: Contribution of Short-Range Force to the Images

Toyoaki Eguchi, Y. Hasegawa

研究成果: Article査読

3 被引用数 (Scopus)

抄録

Observation of the rest-atom layer of the [Formula presented] surface is performed by atomic force microscopy. By detecting the force due to the single chemical covalent bond formed between the tip and the sample surface, individual atoms on the layer were clearly resolved. Unprecedented high spatial resolution was achieved by setting the detection force at a small value and by reducing background forces due to the long-range interactions with the small oscillation amplitude of the cantilever and sharp probe tip.

本文言語English
ジャーナルPhysical Review Letters
89
26
DOI
出版ステータスPublished - 2002 1 1
外部発表はい

ASJC Scopus subject areas

  • 物理学および天文学(全般)

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