High Precision Measurement of Twist Elastic Constant K22 of Liquid Crystal Materials using Ellipsometry Analysis

Takahiro Ishinabe, Yuzuka Morita, Yuji Ohno, Tetsuya Miyashita, Hideo Fujikake, Tatsuo Uchida

研究成果: Article査読

抄録

We proposed a simple and accurate method for measuring the twist elastic constant K22 of liquidcrystal materials. The novel technique is based on the ellipsometry analysis, and determines the director profile of a twisted nematic liquid crystal cell in the on state. We validated this experimentally, and showed that it is effective for evaluating the response characteristics of liquid crystal displays.

本文言語English
ページ(範囲)52-59
ページ数8
ジャーナルITE Transactions on Media Technology and Applications
2
1
DOI
出版ステータスPublished - 2014

ASJC Scopus subject areas

  • Signal Processing
  • Media Technology
  • Computer Graphics and Computer-Aided Design

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