A hard X-ray nano-interferometer using two types of zone plate has been developed. One is an ordinary zone plate for a microscope objective, and the other is a newly designed zone plate called an "annular zone plate" for configuring reference waves. We have succeeded in producing interference fringes with variable periods up to a fringeless pattern. The phase-shift distribution of polystyrene microparticles could be imaged clearly with a spatial resolution of 60 nm and a phase sensitivity of λ/40 at a photon energy of 8keV. Furthermore, this interferometer was applied to phase tomography for high-spatial-resolution three-dimensional observation.
|ジャーナル||Japanese Journal of Applied Physics, Part 2: Letters|
|出版ステータス||Published - 2006 11月 10|
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