Hard X-ray nano-interferometer and its application to high-spatial- resolution phase tomography

Takahisa Koyama, Takuya Tsuji, Keisuke Yoshida, Hidekazu Takano, Yoshiyuki Tsusaka, Yasushi Kagoshima

研究成果: Article査読

31 被引用数 (Scopus)

抄録

A hard X-ray nano-interferometer using two types of zone plate has been developed. One is an ordinary zone plate for a microscope objective, and the other is a newly designed zone plate called an "annular zone plate" for configuring reference waves. We have succeeded in producing interference fringes with variable periods up to a fringeless pattern. The phase-shift distribution of polystyrene microparticles could be imaged clearly with a spatial resolution of 60 nm and a phase sensitivity of λ/40 at a photon energy of 8keV. Furthermore, this interferometer was applied to phase tomography for high-spatial-resolution three-dimensional observation.

本文言語English
ページ(範囲)L1159-L1161
ジャーナルJapanese Journal of Applied Physics, Part 2: Letters
45
42-45
DOI
出版ステータスPublished - 2006 11月 10
外部発表はい

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(その他)
  • 物理学および天文学(全般)

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