抄録
We have investigated the bulk and surface electronic structures of Sm 4As3 by using hard and soft X-ray photoemission spectroscopies (PESs). The valence band spectral shape changes much with photon energies (hν s) due to the variation of both photoionization cross sections and bulk sensitivity. PES with the wide range of hν s between 220 and 2450 eV demonstrates that the valence of the Sm ions is definitely trivalent in the bulk and divalent at the surface.
本文言語 | English |
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ページ(範囲) | 617-619 |
ページ数 | 3 |
ジャーナル | Journal of Electron Spectroscopy and Related Phenomena |
巻 | 144-147 |
DOI | |
出版ステータス | Published - 2005 6月 |
外部発表 | はい |
ASJC Scopus subject areas
- 電子材料、光学材料、および磁性材料
- 放射線
- 原子分子物理学および光学
- 凝縮系物理学
- 分光学
- 物理化学および理論化学