Growth temperature dependence of the LaAlO3/SrTiO3 interfacial structure

Yusuke Wakabayashi, Yoshihiro Yamasaki, Christopher Bell, Yasuyuki Hikita, Harold Y. Hwang, Tsuyoshi Kimura

研究成果: Conference article査読

1 被引用数 (Scopus)

抄録

The growth temperature dependence of the interfacial structure of LaAlO3 thin films on SrTiO3 substrates is clearly observed by means of surface x-ray diffraction, combined with a holographic analysis. Although the interfacial structure that is tuned by the fabrication condition is known as a key to the control of various film properties, such a minute change in structure has not been studied in detail. Our observations show that a microscopic evaluation of the interfacial structure, as a function of the growth conditions, is achievable.

本文言語English
論文番号012074
ジャーナルJournal of Physics: Conference Series
320
DOI
出版ステータスPublished - 2011
外部発表はい
イベントInternational Conference on Frustration in Condensed Matter, ICFCM - Sendai, Japan
継続期間: 2011 1月 112011 1月 14

ASJC Scopus subject areas

  • 物理学および天文学(全般)

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