Growth of a bismuth thin film on the five-fold surface of the icosahedral Ag-In-Yb quasicrystal

S. S. Hars, H. R. Sharma, J. A. Smerdon, S. Coates, K. Nozawa, A. P. Tsai, R. McGrath

研究成果: Article査読

3 被引用数 (Scopus)

抄録

We present a study of growth of quasicrystalline bismuth (Bi) thin films on the five-fold surface of the icosahedral Ag-In-Yb quasicrystal using scanning tunnelling microscopy (STM). The main building block of the Ag-In-Yb quasicrystal is a rhombic triacontahedral (RTH) cluster, which is formed by successive shells of atoms. The surface is formed at bulk planes which intersect the centres of the RTH clusters. We show that the deposited Bi atoms occupy vacant sites above the surface where the atoms of the RTH clusters would be and thus Bi grows with three-dimensional quasicrystalline order. Further deposition of Bi yields crystalline Bi islands aligned along high symmetry directions of the substrate.

本文言語English
ページ(範囲)222-227
ページ数6
ジャーナルSurface Science
678
DOI
出版ステータスPublished - 2018 12

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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