TY - JOUR
T1 - Growth and structural properties of Bi(FexSc1-x)O3 thin films
AU - Murakami, M.
AU - Aronova, M. A.
AU - Wuttig, M.
AU - Takeuchi, I.
AU - Trolier-Mckinstry, S.
AU - McDonald, K.
AU - Knoesel, E.
AU - Lofland, S. E.
AU - Chikyow, T.
AU - Aoyama, T.
AU - Nakajima, K.
PY - 2007/3
Y1 - 2007/3
N2 - Epitaxial Bi(FexSc1-x)O3 thin films with a range of compositions were fabricated by pulsed laser deposition on SrTiO3 (001) substrates with a BiFeO3 buffer layer. X-ray diffraction and transmission electron microscopy reveal that this composition series forms a solid solution in the thin film form. Second harmonic generation measurements showed a maximum at x = 0.7, which may be associated with a phase transition. The present BiScO3 films did not exhibit ferroelectric or antiferroelectric behaviour at the field levels which could be probed.
AB - Epitaxial Bi(FexSc1-x)O3 thin films with a range of compositions were fabricated by pulsed laser deposition on SrTiO3 (001) substrates with a BiFeO3 buffer layer. X-ray diffraction and transmission electron microscopy reveal that this composition series forms a solid solution in the thin film form. Second harmonic generation measurements showed a maximum at x = 0.7, which may be associated with a phase transition. The present BiScO3 films did not exhibit ferroelectric or antiferroelectric behaviour at the field levels which could be probed.
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U2 - 10.1080/09500830601175504
DO - 10.1080/09500830601175504
M3 - Article
AN - SCOPUS:33947653153
VL - 87
SP - 241
EP - 247
JO - Philosophical Magazine Letters
JF - Philosophical Magazine Letters
SN - 0950-0839
IS - 3-4
ER -