Growth and structural properties of Bi(FexSc1-x)O3 thin films

M. Murakami, M. A. Aronova, M. Wuttig, I. Takeuchi, S. Trolier-Mckinstry, K. McDonald, E. Knoesel, S. E. Lofland, T. Chikyow, T. Aoyama, K. Nakajima

研究成果: Article査読

3 被引用数 (Scopus)

抄録

Epitaxial Bi(FexSc1-x)O3 thin films with a range of compositions were fabricated by pulsed laser deposition on SrTiO3 (001) substrates with a BiFeO3 buffer layer. X-ray diffraction and transmission electron microscopy reveal that this composition series forms a solid solution in the thin film form. Second harmonic generation measurements showed a maximum at x = 0.7, which may be associated with a phase transition. The present BiScO3 films did not exhibit ferroelectric or antiferroelectric behaviour at the field levels which could be probed.

本文言語English
ページ(範囲)241-247
ページ数7
ジャーナルPhilosophical Magazine Letters
87
3-4
DOI
出版ステータスPublished - 2007 3

ASJC Scopus subject areas

  • 凝縮系物理学

フィンガープリント

「Growth and structural properties of Bi(FexSc1-x)O3 thin films」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル