Group delay ripple reduction and reflectivity increase in a chirped fiber Bragg grating by multiple-overwriting of a phase mask with an electron-beam

Tetsuro Komukai; Tetsuro Inui; Masataka Nakazawa

doi:10.1109/68.853510

Group delay ripple reduction and reflectivity increase in a chirped fiber Bragg grating by multiple-overwriting of a phase mask with an electron-beam

Tetsuro Komukai, Tetsuro Inui, Masataka Nakazawa

研究成果: Article › 査読

20 被引用数 (Scopus)

抄録

The phase errors in electron-beam-written step-chirped masks can be reduced by using a method based on the continuous movement approach and overwriting a pattern at the same place on the substrate several times. The group delay ripple of chirped fiber Bragg gratings fabricated by a four-times-overwritten phase mask is comparable with that of gratings obtained using a holographically written chirped phase mask.

本文言語	English
ページ（範囲）	816-818
ページ数	3
ジャーナル	IEEE Photonics Technology Letters
巻	12
号	7
DOI	https://doi.org/10.1109/68.853510
出版ステータス	Published - 2000 7月
外部発表	はい

ASJC Scopus subject areas

電子材料、光学材料、および磁性材料
原子分子物理学および光学
電子工学および電気工学

文献へのアクセス

10.1109/68.853510

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引用スタイル

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