Grain boundary analysis of Lu-doped Al2O3 by EDS and EELS

H. Yoshida, Y. Ikuhara, T. Sakuma

    研究成果: Article査読

    抄録

    High-temperature mechanical property in ceramics is directly related to the atomic structure and the chemical bonding strength in the grain boundaries. Transmission electron microscopy is a powerful tool to characterize the grain boundary structure. In this paper, the atomic structure and chemical bonding state at the grain boundaries in 0.05 mol%Lu2O3-doped Al2O3 polycrystalline, which shows an excellent high-temperature creep resistance, was investigated by high-resolution electron microscopy (HREM), energy dispersive X-ray spectroscopy (EDS), scanning transmission electron microscopy (STEM) and electron energy loss spectroscopy (EELS). In addition, a first principle molecular orbital calculation (MO) was made to examine the unoccupied density of states and chemical bonding state at the grain boundary.

    本文言語English
    ページ(範囲)356-360
    ページ数5
    ジャーナルNippon Kinzoku Gakkaishi/Journal of the Japan Institute of Metals
    65
    5
    DOI
    出版ステータスPublished - 2001

    ASJC Scopus subject areas

    • 凝縮系物理学
    • 材料力学
    • 金属および合金
    • 材料化学

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