TY - JOUR
T1 - Glancing-incidence and glancing-takeoff X-ray fluorescence analysis of a Mn ultrathin film on an Au layer
AU - Tsuji, Kouichi
AU - Sato, Shigeo
AU - Hirokawa, Kichinosuke
PY - 1996/3
Y1 - 1996/3
N2 - We have developed a new analytical method, the glancing-incidence and glancing-takeoff X-ray fluorescence (GIT-XRF) method. By using this method, X-ray fluorescence can be measured at various incident and takeoff angles, and the experimental results are compared with the calculated curves. As a result, we can obtain information such as the thickness and density of thin films. Compared with the total reflection X-ray fluorescence method, the advantages of the GIT-XRF method are that it allows a surface-sensitive analysis and a detailed thin-film analysis. In this paper, we will show how the GIT-XRF method is useful for thin-film analysis of Mn-Au double layers.
AB - We have developed a new analytical method, the glancing-incidence and glancing-takeoff X-ray fluorescence (GIT-XRF) method. By using this method, X-ray fluorescence can be measured at various incident and takeoff angles, and the experimental results are compared with the calculated curves. As a result, we can obtain information such as the thickness and density of thin films. Compared with the total reflection X-ray fluorescence method, the advantages of the GIT-XRF method are that it allows a surface-sensitive analysis and a detailed thin-film analysis. In this paper, we will show how the GIT-XRF method is useful for thin-film analysis of Mn-Au double layers.
KW - Surface and interface states
KW - Surface structure
KW - X-ray emission
KW - X-ray total reflection analysis
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U2 - 10.1016/0040-6090(95)07082-6
DO - 10.1016/0040-6090(95)07082-6
M3 - Article
AN - SCOPUS:0030103781
VL - 274
SP - 18
EP - 22
JO - Thin Solid Films
JF - Thin Solid Films
SN - 0040-6090
IS - 1-2
ER -