The Gilbert damping constant was investigated in polycrystalline Co2MnSi Heusler alloy thin films by ferromagnetic resonance (FMR) technique. Samples were prepared using the magnetron sputtering technique on SiO2 substrate and annealed at various temperatures to control the structure. The intrinsic Gilbert damping constant was obtained from angular dependences of peak-to-peak line widths fitting from FMR spectra using Landau-Lifshitz-Gilbert equation. Intrinsic damping constants of the polycrystalline Co2MnSi films were almost independent of the annealing temperature.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics