Force modulation measurement, in which the tip of AFM cantilever is continuously in contact with the sample surface and is forced to vibrate itself with lower frequency than its resonance, is commonly used to map the distribution of materials of composite systems. Though images obtained by this method are often interpreted as mapping of elasticity and viscosity, they give us merely qualitative information and might be affected by other factors than viscoelastity. We measured force-distance curves in the condition of force modulation and obtained physical properties at each depth of the surface.
|出版ステータス||Published - 2006 10月 19|
|イベント||55th SPSJ Annual Meeting - Nagoya, Japan|
継続期間: 2006 5月 24 → 2006 5月 26
|Other||55th SPSJ Annual Meeting|
|Period||06/5/24 → 06/5/26|
ASJC Scopus subject areas