Fundamental study on dynamic nano-mechanical properties [III] application for force modulation measurement

So Fujinami, Ken Nakajima, Toshio Nishi

    研究成果: Paper査読

    抄録

    Force modulation measurement, in which the tip of AFM cantilever is continuously in contact with the sample surface and is forced to vibrate itself with lower frequency than its resonance, is commonly used to map the distribution of materials of composite systems. Though images obtained by this method are often interpreted as mapping of elasticity and viscosity, they give us merely qualitative information and might be affected by other factors than viscoelastity. We measured force-distance curves in the condition of force modulation and obtained physical properties at each depth of the surface.

    本文言語English
    ページ数1
    出版ステータスPublished - 2006 10月 19
    イベント55th SPSJ Annual Meeting - Nagoya, Japan
    継続期間: 2006 5月 242006 5月 26

    Other

    Other55th SPSJ Annual Meeting
    国/地域Japan
    CityNagoya
    Period06/5/2406/5/26

    ASJC Scopus subject areas

    • 工学(全般)

    フィンガープリント

    「Fundamental study on dynamic nano-mechanical properties [III] application for force modulation measurement」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

    引用スタイル