Frustration of direct photoionization of Ar clusters in intense extreme ultraviolet pulses from a free electron laser

H. Iwayama, K. Nagaya, M. Yao, H. Fukuzawa, X. J. Liu, G. Prümper, M. Okunishi, K. Shimada, K. Ueda, T. Harada, M. Toyoda, Mihiro Yanagihara, M. Yamamoto, K. Motomura, N. Saito, A. Rudenko, J. Ullrich, L. Foucar, A. Czasch, R. DörnerM. Nagasono, A. Higashiya, M. Yabashi, T. Ishikawa, H. Ohashi, H. Kimura

研究成果: Article査読

37 被引用数 (Scopus)

抄録

We have measured the kinetic energies of fragment ions from Ar clusters (average cluster size 〈N〉∼ 10-600) exposed to intense extreme ultraviolet free electron laser pulses (λ ∼ 61 nm, I∼ 1.3× 1011 W cm-2). For small clusters (〈N〉≲ 200), the average kinetic energy of ions strongly increases with increasing the cluster size, indicating a promotion of the multiple ionization, whereas the average kinetic energy is observed to be saturated for 〈N〉≳ 200. Considering how many photoelectrons can escape from the cluster, it was found that the size dependence of the ion kinetic energy exhibited the frustration of direct photoionization, which resulted from the strong Coulomb potential of the highly ionized cluster.

本文言語English
論文番号134019
ジャーナルJournal of Physics B: Atomic, Molecular and Optical Physics
42
13
DOI
出版ステータスPublished - 2009 11 9

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics

フィンガープリント 「Frustration of direct photoionization of Ar clusters in intense extreme ultraviolet pulses from a free electron laser」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル