Field calibration using the energy distribution of field ionization

Toshio Sakurai, Erwin W. Müller

    研究成果: Article査読

    64 被引用数 (Scopus)

    抄録

    The accuracy of data obtained by field-ion microscopy is often limited by a ± 15% uncertainty of converting measured voltages into field strengths. Plotting the difference of relative energy deficits of free-space ionized H2, D2, or Kr for sets of two applied voltages against the logarithm of the voltage ratios yields a field factor k. The surface field F0=Vkrt is obtained with the 3% accuracy by which the tip radius rt can be known. The method is applicable to all metals accessible to field-ion-microscopy.

    本文言語English
    ページ(範囲)532-535
    ページ数4
    ジャーナルPhysical Review Letters
    30
    12
    DOI
    出版ステータスPublished - 1973

    ASJC Scopus subject areas

    • 物理学および天文学(全般)

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