抄録
A ferroelectric-based functional pass-gate is proposed for low-power logic-in-memory VLSI which makes communication bottleneck free. Since non-destructive storage and switching functions are merged into a ferroelectric capacitor, active-device counts become small, which reduces the dynamic power dissipation. The use of ferroelectric-based non-volatile storage makes leakage currents cut off. Applying the ferroelectric-based circuitry to binary CAM implementation results in about half dynamic power reduction and 1/22000 static power reduction, compared to a CMOS implementation under 0.6μm ferroelectric/CMOS.
本文言語 | English |
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ページ | 196-199 |
ページ数 | 4 |
出版ステータス | Published - 2002 |
イベント | 2002 Symposium on VLSI Circuits Digest of Technical Papers - Honolulu, HI, United States 継続期間: 2002 6月 13 → 2002 6月 15 |
Other
Other | 2002 Symposium on VLSI Circuits Digest of Technical Papers |
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国/地域 | United States |
City | Honolulu, HI |
Period | 02/6/13 → 02/6/15 |
ASJC Scopus subject areas
- 電子材料、光学材料、および磁性材料
- 電子工学および電気工学