Feedback mode-based electrochemical imaging of conductivity and topography for large substrate surfaces using an LSI-based amperometric chip device with 400 sensors

Yusuke Kanno, Kosuke Ino, Kumi Y. Inoue, Mustafa Şen, Atsushi Suda, Ryota Kunikata, Masahki Matsudaira, Hiroya Abe, Chen Zhong Li, Hitoshi Shiku, Tomokazu Matsue

研究成果: Article査読

19 被引用数 (Scopus)

抄録

Feedback mode-based electrochemical imaging of conductivity and topography for large substrate surfaces is presented using a large-scale integration (LSI)-based amperometric chip device with 400 sensors at a pitch of 250 μm. The LSI-based chip device has enabled rapid electrochemical imaging of large substrate surfaces, compared to scanning electrochemical microscope (SECM). Substrates modified with conductive and insulating materials were placed onto the device to acquire electrochemical signals from the substrate surface using positive and negative feedback signals. The conductivity and topography of the substrate were successfully imaged, indicating that the feedback mode-based electrochemical imaging with such a device is useful to characterize large-area substrate surfaces.

本文言語English
ページ(範囲)109-113
ページ数5
ジャーナルJournal of Electroanalytical Chemistry
741
DOI
出版ステータスPublished - 2015 3 15

ASJC Scopus subject areas

  • 分析化学
  • 化学工学(全般)
  • 電気化学

フィンガープリント

「Feedback mode-based electrochemical imaging of conductivity and topography for large substrate surfaces using an LSI-based amperometric chip device with 400 sensors」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル