Fast Scanning Method for Measuring Material Homogeneity using the Line-Focus-Beam Ultrasonic-Material-Characterization System

研究成果: Conference contribution

抄録

A new method for measuring material homogeneity using fast scanning technique was proposed and demonstrated with the line-focus-beam ultrasonic-material-characterization (LFB-UMC) system. Similar velocity profiles of leaky surface acoustic wave (LSAW) for a Ca3Ta(Ga0.75Al0.25)3Si2O14[CTGAS] single crystal specimen were successfully obtained by both of the new V(x) and the conventional V(z) methods. We have verified the new V(x) method was 56 times faster than the conventional V(z) method. Although the V(z) method is superior to the V(x) method in a viewpoint of measurement accuracy, the V(x) method has great advantage enabling us to quickly evaluate material homogeneity over the wide area of specimen.

本文言語English
ホスト出版物のタイトルIUS 2020 - International Ultrasonics Symposium, Proceedings
出版社IEEE Computer Society
ISBN(電子版)9781728154480
DOI
出版ステータスPublished - 2020 9 7
イベント2020 IEEE International Ultrasonics Symposium, IUS 2020 - Las Vegas, United States
継続期間: 2020 9 72020 9 11

出版物シリーズ

名前IEEE International Ultrasonics Symposium, IUS
2020-September
ISSN(印刷版)1948-5719
ISSN(電子版)1948-5727

Conference

Conference2020 IEEE International Ultrasonics Symposium, IUS 2020
CountryUnited States
CityLas Vegas
Period20/9/720/9/11

ASJC Scopus subject areas

  • Acoustics and Ultrasonics

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