Fabrication process dependency of dosimetric and scintillation properties of sapphire crystals

Yutaka Fujimoto, Takayuki Yanagida, Yoshisuke Futami

研究成果: Conference contribution

抜粋

Dosimetric, and scintillation properties of undoped sapphire (Al 2O3) single crystal fabricated by different methods of the Czochralski (Cz) and the Bridgman were investigated. In X-ray induced radioluminescence spectra, they showed emission peaks at 240 and 300 nm due to exciton and F+ centers, respectively. Scintillation decay times of F+ center was fast around few ns. As a dosimetric property, from 0.01 to 2 Gy X-ray was exposed to them and they exhibited a thermally stimulated luminescence (TSL) with a good linearity. The glow peaks of them were similar, 150, 250, and 325 °C. In TSL, the Bridgeman sample represented only F-center emission while the Cz sample showed F at 400 nm and F+ at 300 nm centers emission.

元の言語English
ホスト出版物のタイトル2013 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013
出版者Institute of Electrical and Electronics Engineers Inc.
ISBN(印刷物)9781479905348
DOI
出版物ステータスPublished - 2013 1 1
外部発表Yes
イベント2013 60th IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013 - Seoul, Korea, Republic of
継続期間: 2013 10 272013 11 2

出版物シリーズ

名前IEEE Nuclear Science Symposium Conference Record
ISSN(印刷物)1095-7863

Other

Other2013 60th IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013
Korea, Republic of
Seoul
期間13/10/2713/11/2

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Radiology Nuclear Medicine and imaging

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  • これを引用

    Fujimoto, Y., Yanagida, T., & Futami, Y. (2013). Fabrication process dependency of dosimetric and scintillation properties of sapphire crystals. : 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013 [6829629] (IEEE Nuclear Science Symposium Conference Record). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NSSMIC.2013.6829629