Evidence of rhombohedral structure within BiFeO3 thin film grown on SrTiO3

In Tae Bae, Hiroshi Naganuma

研究成果: Article査読

8 被引用数 (Scopus)

抄録

Comprehensive crystal structure analysis was performed for a BiFeO3 thin layer (∼30 nm) grown on a SrTiO3 substrate using cross-sectional transmission electron microscopy along three different zone axes. Nano-beam electron diffraction patterns combined with structure factor calculations and high-resolution transmission electron microscopy images unambiguously revealed that the BiFeO3 thin layer grew with a rhombohedral structure identical to its bulk form. No evidence of monoclinic and/or tetragonal distortion was found. The rhombohedral BiFeO3 thin layer was found to grow onto SrTiO3 by maintaining an epitaxial relationship in a manner minimizing the lattice mismatch at the BiFeO3/SrTiO3interface.

本文言語English
論文番号031501
ジャーナルApplied Physics Express
8
3
DOI
出版ステータスPublished - 2015 3 1

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(全般)

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