@inproceedings{7a4944df98a542ddb36595cd333043f8,
title = "Evaluation of substrate noise coupling in RFICs (invited)",
abstract = "Substrate noise coupling and impacts on RF integrated circuits (RFICs) have been intensively studied for intending a single chip solution of wireless communication systems. On-chip measurements characterize noises from digital parts of mixed-signal ICs in terms of noise generation as well as noise propagation through a silicon substrate, demonstrated by silicon results with sub-100 nm CMOS test vehicles. Simulation and emulation help further understanding of the interference of such noises with RFIC operation as well as their impacts on RF communication.",
keywords = "CMOS RF Circuits, Signal Integrity, Substrate Noise",
author = "Makoto Nagata and Xihua Lin and Naoya Azuma and Masahiro Yamaguchi",
year = "2011",
month = dec,
day = "1",
doi = "10.1109/RFIT.2011.6141785",
language = "English",
isbn = "9781457705182",
series = "2011 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2011",
pages = "141--144",
booktitle = "2011 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2011",
note = "4th IEEE International Symposium on Radio-Frequency Integration Technology, RFIT2011 ; Conference date: 30-11-2011 Through 02-12-2011",
}