Evaluation of substrate noise coupling in RFICs (invited)

Makoto Nagata, Xihua Lin, Naoya Azuma, Masahiro Yamaguchi

研究成果: Conference contribution

1 被引用数 (Scopus)

抄録

Substrate noise coupling and impacts on RF integrated circuits (RFICs) have been intensively studied for intending a single chip solution of wireless communication systems. On-chip measurements characterize noises from digital parts of mixed-signal ICs in terms of noise generation as well as noise propagation through a silicon substrate, demonstrated by silicon results with sub-100 nm CMOS test vehicles. Simulation and emulation help further understanding of the interference of such noises with RFIC operation as well as their impacts on RF communication.

本文言語English
ホスト出版物のタイトル2011 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2011
ページ141-144
ページ数4
DOI
出版ステータスPublished - 2011 12 1
イベント4th IEEE International Symposium on Radio-Frequency Integration Technology, RFIT2011 - Beijing, China
継続期間: 2011 11 302011 12 2

出版物シリーズ

名前2011 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2011

Other

Other4th IEEE International Symposium on Radio-Frequency Integration Technology, RFIT2011
CountryChina
CityBeijing
Period11/11/3011/12/2

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Electrical and Electronic Engineering

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