Pixellated mercuric iodide (HgI2) detectors with thickness of 5 and 10 nun have been investigated using depth sensing single polarity charge sensing technique at room temperatures. By acquiring energy spectra of 137Cs as a function of the interaction depth, an insensitive region exhibiting poor spectroscopic performance was observed in the vicinity of the cathode surface of a 10 mm thick HgI2 detector operated at 2500 V, while the other regions of the detector present clear photopeaks with good energy resolutions. The thickness of the insensitive region is estimated to be around 2 mm. The electron mobility-lifetime (μτ) product was estimated based on the change of photopeak amplitude at different bias voltages. The value of electron μτ product was estimated to be around 1.9 × 10 -3 cm2/V which is smaller than the value of 7.4 × 10-3 cm2/V reported earlier.
|ジャーナル||IEEE Nuclear Science Symposium Conference Record|
|出版ステータス||Published - 2004 12 1|
|イベント||2004 Nuclear Science Symposium, Medical Imaging Conference, Symposium on Nuclear Power Systems and the 14th International Workshop on Room Temperature Semiconductor X- and Gamma- Ray Detectors - Rome, Italy|
継続期間: 2004 10 16 → 2004 10 22
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