Evaluation of Magnetization Process in Thin Film Head by Spin-Polarized SEM

S. Sudo, R. Arai, K. Nishioka, K. Mitsuoka, S. Narishige, Y. Sugita

研究成果: Article査読

抄録

The magnetic domain structures of NiFe films in thin film heads driven by dc and ac currents were investigated using spin-polarized SEM, in order to study the magnetization process under high-frequency magnetic fields. The image contrast under a high-frequency magnetic field was calculated as the time-averaged component of the magnetization along the detection direction due to magnetization rotation and to reversible domain wall movement. From the relation between the observed domain images and the calculated distribution of the average magnetization about the domain wall, it was found that irreversible domain wall movement occurs throughout the magnetic core under high-frequency excitations. Domain walls move slightly and reversibly until the direction of the magnetic field is reversed under high-frequency excitation.

本文言語English
ページ(範囲)3-14
ページ数12
ジャーナルIEEE Translation Journal on Magnetics in Japan
6
1
DOI
出版ステータスPublished - 1991 1月
外部発表はい

ASJC Scopus subject areas

  • 工学(その他)
  • 工学(全般)

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