Evaluation of in-vacuum imaging plate detector for X-ray diffraction microscopy

Yoshinori Nishino, Yukio Takahashi, Masaki Yamamoto, Tetsuya Ishikawa

研究成果: Conference contribution

抄録

We performed evaluation tests of a newly developed in-vacuum imaging plate (IP) detector for x-ray diffraction microscopy. IP detectors have advantages over direct x-ray detection charge-coupled device (CCD) detectors, which have been commonly used in x-ray diffraction microscopy experiments, in the capabilities for a high photon count and for a wide area. The detector system contains two IPs to make measurement efficient by recording data with the one while reading or erasing the other. We compared speckled diffraction patterns of single particles taken with the IP and a direct x-ray detection CCD. The IP was inferior to the CCD in spatial resolution and in signal-to-noise ratio at a low photon count.

本文言語English
ホスト出版物のタイトルSYNCHROTRON RADIATION INSTRUMENTATION
ホスト出版物のサブタイトルNinth International Conference on Synchrotron Radiation Instrumentation
ページ1376-1379
ページ数4
DOI
出版ステータスPublished - 2007 3 26
外部発表はい
イベントSYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation - Daegu, Korea, Republic of
継続期間: 2006 5 282006 6 28

出版物シリーズ

名前AIP Conference Proceedings
879
ISSN(印刷版)0094-243X
ISSN(電子版)1551-7616

Other

OtherSYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation
国/地域Korea, Republic of
CityDaegu
Period06/5/2806/6/28

ASJC Scopus subject areas

  • 物理学および天文学(全般)

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