Evaluation of a Flat-Field Grazing Incidence Spectrometer for Highly Charged Ion Plasma Emission in 1–10 nm

Y. Kondo, T. H. Dinh, T. Tamura, S. Ohta, K. Kitano, T. Ejima, T. Hatano, T. Higashiguchi

    研究成果: Conference contribution

    抄録

    A flat-field grazing incident spectrometer was built to investigate highly charged ion (HCI) plasmas in the spectral region from 1 to 10 nm. The spectrometer consists of a flat-filed grating with 2400 lines/mm as a dispersing element and an X-ray charged-coupled device (CCD) camera as the detector. In order to produce accurate intensity calibrated spectra of the HCI plasmas, the diffraction efficiency of the grating and the sensitivity of the CCD camera were directly measured by using the reflectometer installed at the BL-11D of the Photon Factory (PF). We also studied the calibrated spectra of Gd HCI plasmas which were produced by an Nd:YAG laser.

    本文言語English
    ホスト出版物のタイトルX-Ray Lasers 2016 - Proceedings of the 15th International Conference on X-Ray Lasers
    編集者Tetsuya Kawachi, Sergei V. Bulanov, Hiroyuki Daido, Yoshiaki Kato
    出版社Springer Science and Business Media, LLC
    ページ409-412
    ページ数4
    ISBN(印刷版)9783319730240
    DOI
    出版ステータスPublished - 2018
    イベント15th International Conference on X-Ray Lasers, ICXRL 2016 - Nara, Japan
    継続期間: 2016 5月 222016 5月 27

    出版物シリーズ

    名前Springer Proceedings in Physics
    202
    ISSN(印刷版)0930-8989
    ISSN(電子版)1867-4941

    Other

    Other15th International Conference on X-Ray Lasers, ICXRL 2016
    国/地域Japan
    CityNara
    Period16/5/2216/5/27

    ASJC Scopus subject areas

    • 物理学および天文学(全般)

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