Evaluate damage in DNA molecules resulting by very-low-frequency magnetic fields using bacterial gene expression system for mutation repairing system

Akira Igarashi; Koichiro Kobayashi; Hidetoshi Matsuki; Ginro Endo; Akira Haga

Evaluate damage in DNA molecules resulting by very-low-frequency magnetic fields using bacterial gene expression system for mutation repairing system

Akira Igarashi, Koichiro Kobayashi, Hidetoshi Matsuki, Ginro Endo, Akira Haga

未来科学技術共同研究センター

研究成果: Conference contribution

本文言語	English
ホスト出版物のタイトル	INTERMAG ASIA 2005
ホスト出版物のサブタイトル	Digests of the IEEE International Magnetics Conference
ページ数	1
出版ステータス	Published - 2005 12 12
イベント	INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference - Nagoya, Japan 継続期間: 2005 4 4 → 2005 4 8

出版物シリーズ

名前	INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference

Other

Other	INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference
Country	Japan
City	Nagoya
Period	05/4/4 → 05/4/8

ASJC Scopus subject areas

Engineering(all)

文献へのアクセス

引用スタイル

Igarashi, A., Kobayashi, K., Matsuki, H., Endo, G., & Haga, A. (2005). Evaluate damage in DNA molecules resulting by very-low-frequency magnetic fields using bacterial gene expression system for mutation repairing system. In INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference (INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference).

Evaluate damage in DNA molecules resulting by very-low-frequency magnetic fields using bacterial gene expression system for mutation repairing system. / Igarashi, Akira; Kobayashi, Koichiro; Matsuki, Hidetoshi; Endo, Ginro; Haga, Akira.

INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference. 2005. (INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference).

研究成果: Conference contribution

Igarashi, A, Kobayashi, K, Matsuki, H, Endo, G & Haga, A 2005, Evaluate damage in DNA molecules resulting by very-low-frequency magnetic fields using bacterial gene expression system for mutation repairing system. in INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference. INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference, INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference, Nagoya, Japan, 05/4/4.

Igarashi, Akira ; Kobayashi, Koichiro ; Matsuki, Hidetoshi ; Endo, Ginro ; Haga, Akira. / Evaluate damage in DNA molecules resulting by very-low-frequency magnetic fields using bacterial gene expression system for mutation repairing system. INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference. 2005. (INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference).

@inproceedings{ea75ad899e544f9bad27a7afa8f5196d,

title = "Evaluate damage in DNA molecules resulting by very-low-frequency magnetic fields using bacterial gene expression system for mutation repairing system",

author = "Akira Igarashi and Koichiro Kobayashi and Hidetoshi Matsuki and Ginro Endo and Akira Haga",

year = "2005",

month = dec,

day = "12",

language = "English",

isbn = "0780390091",

series = "INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference",

booktitle = "INTERMAG ASIA 2005",

note = "INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference ; Conference date: 04-04-2005 Through 08-04-2005",

}

TY - GEN

T1 - Evaluate damage in DNA molecules resulting by very-low-frequency magnetic fields using bacterial gene expression system for mutation repairing system

AU - Igarashi, Akira

AU - Kobayashi, Koichiro

AU - Matsuki, Hidetoshi

AU - Endo, Ginro

AU - Haga, Akira

PY - 2005/12/12

Y1 - 2005/12/12

UR - http://www.scopus.com/inward/record.url?scp=28444498377&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=28444498377&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:28444498377

SN - 0780390091

T3 - INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference

BT - INTERMAG ASIA 2005

T2 - INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference

Y2 - 4 April 2005 through 8 April 2005

ER -