Error compensation of single-qubit gates in a surface-electrode ion trap using composite pulses

Emily Mount, Chingiz Kabytayev, Stephen Crain, Robin Harper, So Young Baek, Geert Vrijsen, Steven T. Flammia, Kenneth R. Brown, Peter Maunz, Jungsang Kim

研究成果: Article査読

27 被引用数 (Scopus)

抄録

The fidelity of laser-driven quantum logic operations on trapped ion qubits tend to be lower than microwave-driven logic operations due to the difficulty of stabilizing the driving fields at the ion location. Through stabilization of the driving optical fields and use of composite pulse sequences, we demonstrate high-fidelity single-qubit gates for the hyperfine qubit of a Yb+171 ion trapped in a microfabricated surface-electrode ion trap. Gate error is characterized using a randomized benchmarking protocol and an average error per randomized Clifford group gate of 3.6(3)×10-4 is measured. We also report experimental realization of palindromic pulse sequences that scale efficiently in sequence length.

本文言語English
論文番号060301
ジャーナルPhysical Review A - Atomic, Molecular, and Optical Physics
92
6
DOI
出版ステータスPublished - 2015 12 16
外部発表はい

ASJC Scopus subject areas

  • 原子分子物理学および光学

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