Equivalent complex refractive indices for ray-tracing evaluation of dielectric-coated hollow waveguides

Katsumasa Iwai; Yukio Abe; Yuji Matsuura; Mitsunobu Miyagi

doi:10.1117/1.1485090

Equivalent complex refractive indices for ray-tracing evaluation of dielectric-coated hollow waveguides

Katsumasa Iwai, Yukio Abe, Yuji Matsuura, Mitsunobu Miyagi

医工学研究科・医工学専攻

研究成果: Article › 査読

2 被引用数 (Scopus)

抄録

An idea of an equivalent refractive index for the ray tracing calculation of hollow core waveguides is proposed. A virtual, complex refractive index is uniquely found by minimizing the difference between reflectivity of a virtual monolayer material and a metal substrate coated with a dielectric film. By using this technique, transmission losses of a delivery system consisting of a hollow fiber and a tapered hollow waveguide are calculated.

本文言語	English
ページ（範囲）	1471-1472
ページ数	2
ジャーナル	Optical Engineering
巻	41
号	7
DOI	https://doi.org/10.1117/1.1485090
出版ステータス	Published - 2002 7月 1

ASJC Scopus subject areas

原子分子物理学および光学
工学（全般）

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10.1117/1.1485090

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KW - Infrared lasers

KW - Optical design

KW - Refractive index

KW - Waveguides

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Equivalent complex refractive indices for ray-tracing evaluation of dielectric-coated hollow waveguides

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