Epitaxial growth and electronic structure of oxyhydride SrVO2H thin films

Tsukasa Katayama, Akira Chikamatsu, Keisuke Yamada, Kei Shigematsu, Tomoya Onozuka, Makoto Minohara, Hiroshi Kumigashira, Eiji Ikenaga, Tetsuya Hasegawa

研究成果: Article査読

10 被引用数 (Scopus)

抄録

Oxyhydride SrVO2H epitaxial thin films were fabricated on SrTiO3 substrates via topotactic hydridation of oxide SrVO3 films using CaH2. Structural and composition analyses suggested that the SrVO2H film possessed one-dimensionally ordered V-H--V bonds along the out-of-plane direction. The synthesis temperature could be lowered by reducing the film thickness, and the SrVO2H film was reversible to SrVO3 by oxidation through annealing in air. Photoemission and X-ray absorption spectroscopy measurements revealed the V3+ valence state in the SrVO2H film, indicating that the hydrogen existed as hydride. Furthermore, the electronic density of states was highly suppressed at the Fermi energy, consistent with the prediction that tetragonal distortion induces metal to insulation transition.

本文言語English
論文番号085305
ジャーナルJournal of Applied Physics
120
8
DOI
出版ステータスPublished - 2016 8 28
外部発表はい

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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