Energy-dispersive X-ray diffraction(EDXD) technique for structural studies of disordered materials. Application to SiO2, SrP2O6, Pd80Si20, Fe40Ni40P14B6 glasses and liquid Hg

K. Sugiyama, V. P. Petkov, A. S. Takeda

研究成果: Article査読

1 被引用数 (Scopus)

抄録

Structure factors in the wave vector Q region larger than 200 nm-1 and corresponding radial distribution functions with improved resolution for SiO2 and SrP2O6 oxide glasses, Pd80Si20 and Fe40Ni40P14B6 metallic glasses, and liquid Hg have been obtained by the energy dispersive X-ray diffraction (EDXD) method. Structure data obtained by the present study were compared with the previous wide-angle diffraction experiments of the same disordered materials and the reliability and usefulness of EDXD method were demonstrated.

本文言語English
ページ(範囲)49-56
ページ数8
ジャーナルHigh Temperature Materials and Processes
16
1
DOI
出版ステータスPublished - 1997 1 1

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Physical and Theoretical Chemistry

フィンガープリント 「Energy-dispersive X-ray diffraction(EDXD) technique for structural studies of disordered materials. Application to SiO<sub>2</sub>, SrP<sub>2</sub>O<sub>6</sub>, Pd<sub>80</sub>Si<sub>20</sub>, Fe<sub>40</sub>Ni<sub>40</sub>P<sub>14</sub>B<sub>6</sub> glasses and liquid Hg」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

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