Elemental X-ray images obtained by grazing-exit electron probe microanalysis (GE-EPMA)

Kouichi Tsuji, Rik Nullens, Kazuaki Wagatsuma, René E. Van Grieken

研究成果: Article査読

11 被引用数 (Scopus)

抄録

A new method, grazing-exit electron probe microanalysis (GE-EPMA), was studied. Only X-rays emitted from the near-surface layer are measured at grazing-exit angles (e.g. <0.5°), whereas, with conventional EPMA, X-rays emitted from deep positions are also measured. Therefore, X-ray spectra with low background are obtained by GE-EPMA. Here, elemental mapping by GE-EPMA is shown for the first time. It was found that surface-sensitive elemental X-ray images were obtained for a thin Au film deposited on a Si wafer. The problems that occur at boundaries of different heights are discussed. Furthermore, it was difficult to recognize elemental distributions of Si, S, Ca, Na and Fe for aerosols deposited on a Si wafer in noisy X-ray images when using conventional EPMA; however, clear X-ray images were obtained under grazing-exit conditions.

本文言語English
ページ(範囲)1711-1713
ページ数3
ジャーナルJournal of analytical atomic spectrometry
14
11
DOI
出版ステータスPublished - 1999 12 1

ASJC Scopus subject areas

  • 分析化学
  • 分光学

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