Element specific imaging by scanning tunneling microscopy combined with synchrotron radiation light

Toyoaki Eguchi, Taichi Okuda, Takeshi Matsushima, Akira Kataoka, Ayumi Harasawa, Kotone Akiyama, Toyohiko Kinoshita, Yukio Hasegawa, Masanori Kawamori, Yuichi Haruyama, Shinji Matsui

研究成果: Article査読

28 被引用数 (Scopus)

抄録

Microscopic surface images showing a distribution of a designated element was obtained by scanning tunneling microscopy combined with synchrotron radiation light. A tip current induced by photoirradiation is found to increase when the photon energy is just above the absorption edge of a sample element. From the photoinduced current measured during the tip scanning over the surface, element specific images were obtained. An estimated spatial resolution of the chemical imaging is less than 20 nm, better than that achieved by photoemission electron microscopy.

本文言語English
論文番号243119
ジャーナルApplied Physics Letters
89
24
DOI
出版ステータスPublished - 2006
外部発表はい

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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