Electronic structure characterization of La2NiMnO6 epitaxial thin films using synchrotron-radiation photoelectron spectroscopy and optical spectroscopy

M. Kitamura, I. Ohkubo, M. Matsunami, K. Horiba, H. Kumigashira, Y. Matsumoto, H. Koinuma, M. Oshima

研究成果: Article査読

29 被引用数 (Scopus)

抄録

Electronic structures of La2NiMnO6 epitaxial films are characterized using synchrotron-radiation photoelectron spectroscopy and optical spectroscopy. X-ray absorption spectra reveal that the valence states of Ni2+ and Mn4+ are dominant. The electronic structure at the valence band maximum is mainly derived from the Mn 3d state. The conduction band minimum is composed mostly of the Mn 3d-O 2p hybridized state. The optical gap is estimated to be about 1.5 eV based on the optical conductivity derived from optical spectra.

本文言語English
論文番号262503
ジャーナルApplied Physics Letters
94
26
DOI
出版ステータスPublished - 2009
外部発表はい

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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