抄録
This review summarizes the recent advances in electron tomography (ET) and its application to polymer nanostructures. Truly quantitative three-dimensional (3D) images of polymer nanostructures can now be obtained by reducing or eliminating the missing tilt range in ET experiments. The reduction of the resulting missing wedge provides sub-nanometer resolution, which is sufficiently small for soft materials. Because soft materials often exhibit hierarchical structures, observation of a large volume with edges several micrometers in length is important to capture the structural elements on a scale larger than tens of nanometers. The introduction of scanning optics to ET has made it possible to obtain 3D data from micrometer-thick polymer specimens by using conventional electron microscopes at a relatively low accelerating voltage of 200 kV. We present some examples of the structural analysis of soft materials, such as nanostructures of self-assembled block copolymers and fuel cell electrodes.
本文言語 | English |
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ページ(範囲) | 135-142 |
ページ数 | 8 |
ジャーナル | Current Opinion in Solid State and Materials Science |
巻 | 17 |
号 | 3 |
DOI | |
出版ステータス | Published - 2013 6 |
外部発表 | はい |
ASJC Scopus subject areas
- Materials Science(all)