Electron spectroscopic study of nanoplasma formation triggered by intense soft X-ray pulses

Akinobu Niozu, Naomichi Yokono, Toshiyuki Nishiyama, Hironobu Fukuzawa, Tomohiro Sakurazawa, Kazuhiro Matsuda, Tsukasa Takanashi, Daehyun You, Yiwen Li, Taishi Ono, Thomas Gaumnitz, Markus Schöffler, Sven Grundmann, Shin Ichi Wada, Paolo Carpeggiani, Wei Qing Xu, Xiao Jing Liu, Shigeki Owada, Kensuke Tono, Tadashi TogashiMakina Yabashi, Nikolai V. Kryzhevoi, Kirill Gokhberg, Alexander I. Kuleff, Lorenz S. Cederbaum, Kiyoshi Ueda, Kiyonobu Nagaya

研究成果: Article査読

2 被引用数 (Scopus)

抄録

Using electron spectroscopy, we investigated the nanoplasma formation process generated in xenon clusters by intense soft X-ray free electron laser (FEL) pulses. We found clear FEL intensity dependence of electron spectra. Multistep ionization and subsequent ionization frustration features are evident for the low FEL-intensity region, and the thermal electron emission emerges at the high FEL intensity. The present FEL intensity dependence of the electron spectra is well addressed by the frustration parameter introduced by Arbeiter and Fennel [New J. Phys. 13, 053022 (2011)].

本文言語English
論文番号184305
ジャーナルJournal of Chemical Physics
151
18
DOI
出版ステータスPublished - 2019 11 14

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Physical and Theoretical Chemistry

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