Electron-hole recombination on ZnO(0001) single-crystal surface studied by time-resolved soft X-ray photoelectron spectroscopy

R. Yukawa, S. Yamamoto, K. Ozawa, M. Emori, M. Ogawa, Sh Yamamoto, K. Fujikawa, R. Hobara, S. Kitagawa, H. Daimon, H. Sakama, I. Matsuda

研究成果: Article査読

26 被引用数 (Scopus)

抄録

Time-resolved soft X-ray photoelectron spectroscopy (PES) experiments were performed with time scales from picoseconds to nanoseconds to trace relaxation of surface photovoltage on the ZnO(0001) single crystal surface in real time. The band diagram of the surface has been obtained numerically using PES data, showing a depletion layer which extends to 1 μ m. Temporal evolution of the photovoltage effect is well explained by a recombination process of a thermionic model, giving the photoexcited carrier lifetime of about 1 ps at the surface under the flat band condition. This lifetime agrees with a temporal range reported by the previous time-resolved optical experiments.

本文言語English
論文番号151602
ジャーナルApplied Physics Letters
105
15
DOI
出版ステータスPublished - 2014 10 13
外部発表はい

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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