Electrical resistivity of individual molecular-assembly nanowires of amphiphilic bis-tetrathiafulvalene macrocycle/2,3,5,6-tetrafluoro- 7,7,8,8-tetracyano- p -quinodimethane charge transfer complex characterized by point-contact current-imaging atomic force microscopy

Ryo Tsunashima, Yuki Noda, Yoko Tatewaki, Shin Ichiro Noro, Tomoyuki Akutagawa, Takayoshi Nakamura, Takuya Matsumoto, Tomoji Kawai

研究成果: Article査読

8 被引用数 (Scopus)

抄録

Resistivity of individual molecular-assembly nanowires was characterized using the point-contact current-imaging atomic force microscope (PCI-AFM). Current images were simultaneously obtained along with topographic images, from which the mean electrical resistivity of each nanowire was deduced to be approximately 180 cm, which was about two orders of magnitude lower than that measured on bulk Langmuir-Blodgett films (103 - 105 cm).

本文言語English
論文番号173102
ジャーナルApplied Physics Letters
93
17
DOI
出版ステータスPublished - 2008
外部発表はい

ASJC Scopus subject areas

  • 物理学および天文学(その他)

フィンガープリント

「Electrical resistivity of individual molecular-assembly nanowires of amphiphilic bis-tetrathiafulvalene macrocycle/2,3,5,6-tetrafluoro- 7,7,8,8-tetracyano- p -quinodimethane charge transfer complex characterized by point-contact current-imaging atomic force microscopy」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

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