Effects of roughness and temperature on low-energy hydrogen positive and negative ion reflection from silicon and carbon surfaces

N. Tanaka, S. Kato, T. Miyamoto, M. Nishiura, K. Tsumori, Y. Matsumoto, T. Kenmotsu, A. Okamoto, S. Kitajima, M. Sasao, M. Wada, H. Yamaoka

研究成果: Review article › 査読