Effect of surface contamination on destruction and recrystallization dynamics of MgO protecting layer in plasma display panel by molecular dynamics simulation method

Momoji Kubo; Kazumi Serizawa; Hiromi Kikuchi; Riadh Sahnoun; Michihisa Koyama; Hideyuki Tsuboi; Nozomu Hatakeyama; Akira Endou; Hiromitsu Takaba; Carlos A. Del Carpio; Hiroshi Kajiyama; Tsutae Shinoda; Akira Miyamoto

Effect of surface contamination on destruction and recrystallization dynamics of MgO protecting layer in plasma display panel by molecular dynamics simulation method

Momoji Kubo, Kazumi Serizawa, Hiromi Kikuchi, Riadh Sahnoun, Michihisa Koyama, Hideyuki Tsuboi, Nozomu Hatakeyama, Akira Endou, Hiromitsu Takaba, Carlos A. Del Carpio, Hiroshi Kajiyama, Tsutae Shinoda, Akira Miyamoto

研究成果: Paper › 査読

1 被引用数 (Scopus)

抄録

Our original molecular dynamics code was applied to the destruction dynamics of MgO protecting layer in the plasma display panel by Xe sputtering. The effect of surface contamination on the destruction and recrystallization dynamics of the MgO protecting layer was clarified. Especially, we elucidated that adsorbed water molecules are dissociated and hydrogen atoms are intruded into the MgO surface by Xe sputtering. These phenomena were suggested to degrade significantly the second electron emission ability of the MgO protecting layer.

本文言語	English
ページ	787-790
ページ数	4
出版ステータス	Published - 2007 12月 1
イベント	14th International Display Workshops, IDW '07 - Sapporo, Japan 継続期間: 2007 12月 5 → 2007 12月 5

Other

Other	14th International Display Workshops, IDW '07
国/地域	Japan
City	Sapporo
Period	07/12/5 → 07/12/5

ASJC Scopus subject areas

電子工学および電気工学
電子材料、光学材料、および磁性材料
放射線学、核医学およびイメージング
原子分子物理学および光学

他のファイルとリンク

フィンガープリント

「Effect of surface contamination on destruction and recrystallization dynamics of MgO protecting layer in plasma display panel by molecular dynamics simulation method」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル

Kubo, M., Serizawa, K., Kikuchi, H., Sahnoun, R., Koyama, M., Tsuboi, H., Hatakeyama, N., Endou, A., Takaba, H., Del Carpio, C. A., Kajiyama, H., Shinoda, T., & Miyamoto, A. (2007). Effect of surface contamination on destruction and recrystallization dynamics of MgO protecting layer in plasma display panel by molecular dynamics simulation method. 787-790. Paper presented at 14th International Display Workshops, IDW '07, Sapporo, Japan.

Kubo, M, Serizawa, K, Kikuchi, H, Sahnoun, R, Koyama, M, Tsuboi, H, Hatakeyama, N, Endou, A, Takaba, H, Del Carpio, CA, Kajiyama, H, Shinoda, T & Miyamoto, A 2007, 'Effect of surface contamination on destruction and recrystallization dynamics of MgO protecting layer in plasma display panel by molecular dynamics simulation method', Paper presented at 14th International Display Workshops, IDW '07, Sapporo, Japan, 07/12/5 - 07/12/5 pp. 787-790.

@conference{b9812bfdab03454896993de71bb3c324,

title = "Effect of surface contamination on destruction and recrystallization dynamics of MgO protecting layer in plasma display panel by molecular dynamics simulation method",

abstract = "Our original molecular dynamics code was applied to the destruction dynamics of MgO protecting layer in the plasma display panel by Xe sputtering. The effect of surface contamination on the destruction and recrystallization dynamics of the MgO protecting layer was clarified. Especially, we elucidated that adsorbed water molecules are dissociated and hydrogen atoms are intruded into the MgO surface by Xe sputtering. These phenomena were suggested to degrade significantly the second electron emission ability of the MgO protecting layer.",

author = "Momoji Kubo and Kazumi Serizawa and Hiromi Kikuchi and Riadh Sahnoun and Michihisa Koyama and Hideyuki Tsuboi and Nozomu Hatakeyama and Akira Endou and Hiromitsu Takaba and {Del Carpio}, {Carlos A.} and Hiroshi Kajiyama and Tsutae Shinoda and Akira Miyamoto",

year = "2007",

month = dec,

day = "1",

language = "English",

pages = "787--790",

note = "14th International Display Workshops, IDW '07 ; Conference date: 05-12-2007 Through 05-12-2007",

}

TY - CONF

T1 - Effect of surface contamination on destruction and recrystallization dynamics of MgO protecting layer in plasma display panel by molecular dynamics simulation method

AU - Kubo, Momoji

AU - Serizawa, Kazumi

AU - Kikuchi, Hiromi

AU - Sahnoun, Riadh

AU - Koyama, Michihisa

AU - Tsuboi, Hideyuki

AU - Hatakeyama, Nozomu

AU - Endou, Akira

AU - Takaba, Hiromitsu

AU - Del Carpio, Carlos A.

AU - Kajiyama, Hiroshi

AU - Shinoda, Tsutae

AU - Miyamoto, Akira

PY - 2007/12/1

Y1 - 2007/12/1

N2 - Our original molecular dynamics code was applied to the destruction dynamics of MgO protecting layer in the plasma display panel by Xe sputtering. The effect of surface contamination on the destruction and recrystallization dynamics of the MgO protecting layer was clarified. Especially, we elucidated that adsorbed water molecules are dissociated and hydrogen atoms are intruded into the MgO surface by Xe sputtering. These phenomena were suggested to degrade significantly the second electron emission ability of the MgO protecting layer.

AB - Our original molecular dynamics code was applied to the destruction dynamics of MgO protecting layer in the plasma display panel by Xe sputtering. The effect of surface contamination on the destruction and recrystallization dynamics of the MgO protecting layer was clarified. Especially, we elucidated that adsorbed water molecules are dissociated and hydrogen atoms are intruded into the MgO surface by Xe sputtering. These phenomena were suggested to degrade significantly the second electron emission ability of the MgO protecting layer.

UR - http://www.scopus.com/inward/record.url?scp=43349096593&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=43349096593&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:43349096593

SP - 787

EP - 790

T2 - 14th International Display Workshops, IDW '07

Y2 - 5 December 2007 through 5 December 2007

ER -