Effect of resistance at contact boundary of loose connector on electromagnetic radiation

Kazuki Matsuda, Yu-Ichi Hayashi, Takaaki Mizuki, Hideaki Sone

研究成果: Conference contribution

4 被引用数 (Scopus)

抄録

Recently, for the electrical devices operating at high frequency, suppression of electromagnetic radiation field at high-frequency bands is required under EMC guidelines. EMC test measurements and suppression methods for electromagnetic radiation generated at high-frequency bands are under investigation. But, discussion on the electromagnetic radiation resulting from interconnected devices is limited. So, we focus on an effect of connectors which decreases contact performance on electromagnetic radiation when devices are interconnected with each other. In previous studies, we have shown the effect of loose contact of a connector on electromagnetic radiation. These studies have shown that inductance and resistance value at a connector contact boundary are increased by loosening a connector and electromagnetic radiation is increased by changes of values of those high-frequency circuit elements. To investigate the mechanism of increase on electromagnetic radiation field by loose contact connector, we analyze the dominant element of high-frequency circuit to cause electromagnetic radiation. Moreover, to acquire contact requirements for a connector in order to suppress electromagnetic radiation, we compare the impact of inductance and resistance on electromagnetic radiation under different frequencies.

本文言語English
ホスト出版物のタイトル26th International Conference on Electrical Contacts, ICEC 2012
ページ422-425
ページ数4
605 CP
DOI
出版ステータスPublished - 2012 12 1
イベント26th International Conference on Electrical Contacts, ICEC 2012 - Beijing, China
継続期間: 2012 5 142012 5 17

出版物シリーズ

名前IET Conference Publications
番号605 CP
2012

Other

Other26th International Conference on Electrical Contacts, ICEC 2012
CountryChina
CityBeijing
Period12/5/1412/5/17

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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