Effect of external stress on polarization in ferroelectric thin films

Tetsuo Kumazawa, Yukihiro Kumagai, Hideo Miura, Makoto Kitano, Keiko Kushida

研究成果: Article査読

106 被引用数 (Scopus)

抄録

The polarization changes caused by applying mechanical stresses to a lead zirconate titanate (PZT) thin film were investigated. Both the remnant and spontaneous polarizations decreased when the PZT film was loaded with tensile stress. For compressive stresses, the remnant polarization increased, but spontaneous polarization did not change. In fatigue with tensile stress state, the polarization decreased earlier than when there was no stress, which depend on whether or not the initial polarization value was high. Conversely, in fatigue with compressive stress, the initial higher remnant polarization value was maintained compared with the polarization in the unstress condition.

本文言語English
ページ(範囲)608-610
ページ数3
ジャーナルApplied Physics Letters
72
5
DOI
出版ステータスPublished - 1998
外部発表はい

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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