Effect of Damage Introduction and He Existence on D Retention in Tungsten by High Flux D Plasma Exposure

Yasuhisa Oya, Keisuke Azuma, Akihiro Togari, Moeko Nakata, Qilai Zhou, Mingzhong Zhao, Tatsuya Kuwabara, Noriyasu Ohno, Miyuki Yajima, Yuji Hatano, Takeshi Toyama

研究成果: Chapter

抄録

Both of radiation-induced damages and helium (He) existence effects on deuterium (D) retention in tungsten (W) by D plasma exposure were evaluated using high flux divertor plasma exposure device, called Compact Divertor Plasma Simulator (CDPS). The results were compared with 3 keV D 2 + implanted W with low flux and fluence. The thermal desorption spectra were consisted of three desorption stages at 400, 600, 780 K. Comparing to the undamaged W, the D desorption stages were shifted towards higher temperature side and the values of D retention increased. It can be said that the formation of stable trapping sites by damage introduction enhances the D trapping in the damaged W. For He + irradiation, D desorption at lower temperature was enhanced, due to the formation of dense dislocation loops. In case of sequential Fe 2+ and He + implantation, D desorption at higher temperature was reduced, comparing to that for only Fe 2+ damaged W. These facts show that the accumulation of He near surface region reduces D diffusion toward bulk, leading to the reduction of D trapping by voids.

本文言語English
ホスト出版物のタイトルLecture Notes in Networks and Systems
出版社Springer
ページ89-96
ページ数8
DOI
出版ステータスPublished - 2019

出版物シリーズ

名前Lecture Notes in Networks and Systems
53
ISSN(印刷版)2367-3370
ISSN(電子版)2367-3389

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Signal Processing
  • Computer Networks and Communications

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