Dynamical elemental mapping at elevated temperature using plasmon loss peaks in electron energy loss spectroscopy

K. Sasaki, S. Tsukimoto, M. Konnno, T. Kamino, H. Saka

    研究成果: Article査読

    抄録

    Dynamic elemental mapping was carried out during an in-situ heating experiment in a transmission electron microscope using plasmon loss peaks in electron energy loss spectroscopy. Migration of oxygen near an interface between Si and SiO2 during the reducing reaction SiO2→Si + O2 was studied by this method.

    本文言語English
    ページ(範囲)338-342
    ページ数5
    ジャーナルNippon Kinzoku Gakkaishi/Journal of the Japan Institute of Metals
    65
    5
    DOI
    出版ステータスPublished - 2001

    ASJC Scopus subject areas

    • 凝縮系物理学
    • 材料力学
    • 金属および合金
    • 材料化学

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