Dynamic mode force microscopy for the detection of lateral and vertical electrostatic forces

S. Watanabe, K. Hane, M. Ito, T. Goto

研究成果: Article査読

8 被引用数 (Scopus)

抄録

In this letter, a variant of scanning force microscope for detecting attractive forces is reported. The force gradients of the attractive forces acting in two orthogonal directions were detected simultaneously from the resonant frequency shifts of a cantilever oscillating in two directions. Using the fine electrode sample, the distributions of the electrostatic forces acting in lateral and vertical directions were visualized separately.

本文言語English
ページ(範囲)2573-2575
ページ数3
ジャーナルApplied Physics Letters
63
18
DOI
出版ステータスPublished - 1993
外部発表はい

ASJC Scopus subject areas

  • 物理学および天文学(その他)

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