Domain wall in (FeCo)-Zr-O thin film profiled by spin-polarized scanning tunneling microscopy

Youhui Gao, Daisuke Shindo, Shigehiro Ohnuma, Hiroyasu Fujimori

    研究成果: Article査読

    1 被引用数 (Scopus)

    抄録

    The domain structure of (FeCo)-Zr-O thin film was observed with spin-polarized scanning tunneling microscopy. A maze domain is characterized by a domain width of about 320 nm, and a wall energy of 4.97 erg cm-2. The tunneling magnetoresistance (TMR) profile is fitted by a tanh function, and a wall thickness of about 100 nm is obtained. This indicates that the TMR is proportional to the angle between the tip and the film magnetizations. Effective exchange and anisotropy constants are estimated at 3.88 × 10-6 erg cm-1 and 3.98 × 105 erg cm-3, respectively.

    本文言語English
    ページ(範囲)574-577
    ページ数4
    ジャーナルScripta Materialia
    59
    5
    DOI
    出版ステータスPublished - 2008 9 1

    ASJC Scopus subject areas

    • 材料科学(全般)
    • 凝縮系物理学
    • 材料力学
    • 機械工学
    • 金属および合金

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