We have performed a temperature-dependent ultrahigh-resolution photoemission spectroscopy on SmB6 to study the "Kondo-insulator" nature. We found a sharp Sm 4f-derived peak about 18 meV away from EF and a pseudogap at EF at low temperature. The pseudogap is gradually filled-in by the transfer of spectral weight from the sharp peak at high temperatures. This indicates that the pseudogap is a Kondo-insulator gap originating in the hybridization between the Sm 4f states and the conduction electrons.
|ジャーナル||Physica B: Condensed Matter|
|出版ステータス||Published - 2002 3|
|イベント||International Conference on Strongly Correlated Electrons - Ann Arbor, MI, United States|
継続期間: 2002 8 6 → 2002 8 6
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