Diagnosis of the profile of the heavy-ion microbeam and estimation of the aiming accuracy of the single-ion-hit with using CR-39

Tsuyoshi Hamano, Toshio Hirao, Isamu Nashiyama, Takuro Sakai, Tomihiro Kamiya, Keizo Ishii, Masahiro Takebe

研究成果: Article査読

抄録

The aiming accuracy of the single-ion-hit method has been studied by the measurement of etch-pit patterns on a CR-39 film irradiated with a heavy-ion microbeam. It becomes clear that the aiming accuracy is determined to be the size of the core-part of the microbeam, which is almost twice as large as the full width at half maximum (FWHM) beam size measured by the conventional secondary electron image method.

本文言語English
ページ(範囲)461-467
ページ数7
ジャーナルRadiation Physics and Chemistry
53
5
DOI
出版ステータスPublished - 1998 11 1

ASJC Scopus subject areas

  • 放射線

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