TY - JOUR
T1 - DFT calculations on atom-specific electronic properties of G/SiC(0001)
AU - Kajihara, M.
AU - Suzuki, T.
AU - Shahed, S. M.F.
AU - Komeda, T.
AU - Minamitani, E.
AU - Watanabe, S.
N1 - Funding Information:
This work was partially supported by JSPS KAKENHI Grant Number 26107514 , and by Grant-in-Aid for Scientific Research on Innovative Areas ‘Molecular Architectonics’ (No. 2509 ) from MEXT. The calculations were performed by using the computer facilities of the Institute of Solid State Physics (ISSP Super Computer Center, University of Tokyo).
Publisher Copyright:
© 2015 Elsevier B.V. All rights reserved.
PY - 2016/5
Y1 - 2016/5
N2 - We investigate the atom-specific interfacial electronic properties of the epitaxial graphene on Si-terminated SiC substrate using density functional theory (DFT) calculation with van der Waals interaction correction, focusing on the dependency of the local electronic state on the chemical environment. The band structure projected on the respective atomic orbitals of the carbon atoms in the buffer layer and uppermost Si atoms demonstrates that the dangling bonds of these atoms form band structures around the Fermi level. The contribution of each atom to the dangling bond states strongly depends on the chemical environment, i.e., the presence/absence of the interlayer Si-C covalent bond. This difference also affects the atom-specific local density of states of the top-layer graphene through its interaction with the substrate/buffer layer. We demonstrate that the bias voltage dependency of the scanning tunneling spectroscopy (STS) mapping image clearly reflects the presence of the dangling bonds of the buffer layer carbon or uppermost Si atom in the substrate, which would enable the detection of the buried dangling bond with an atomic spatial resolution via STS.
AB - We investigate the atom-specific interfacial electronic properties of the epitaxial graphene on Si-terminated SiC substrate using density functional theory (DFT) calculation with van der Waals interaction correction, focusing on the dependency of the local electronic state on the chemical environment. The band structure projected on the respective atomic orbitals of the carbon atoms in the buffer layer and uppermost Si atoms demonstrates that the dangling bonds of these atoms form band structures around the Fermi level. The contribution of each atom to the dangling bond states strongly depends on the chemical environment, i.e., the presence/absence of the interlayer Si-C covalent bond. This difference also affects the atom-specific local density of states of the top-layer graphene through its interaction with the substrate/buffer layer. We demonstrate that the bias voltage dependency of the scanning tunneling spectroscopy (STS) mapping image clearly reflects the presence of the dangling bonds of the buffer layer carbon or uppermost Si atom in the substrate, which would enable the detection of the buried dangling bond with an atomic spatial resolution via STS.
KW - Atom-specific band structure
KW - Density functional calculations
KW - Graphene
KW - Scanning tunneling spectroscopy mapping
KW - Si-terminated SiC
KW - van der Waals interaction correction
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U2 - 10.1016/j.susc.2015.12.004
DO - 10.1016/j.susc.2015.12.004
M3 - Article
AN - SCOPUS:84952759831
SN - 0039-6028
VL - 647
SP - 39
EP - 44
JO - Surface Science
JF - Surface Science
ER -